Stylus contact forces for CMM scanning probes

Contact forces between the workpiece being inspected and the syli on Renishaw CMM scanning probes.

Description

SP600 scanning probeSP600: The relevant spring rate is 1.2 N/mm in the X, Y and Z axes so the force on the component will vary with the amount of deflection. The SP600 measurement range is +/-1 mm with a 50 mm stylus. Therefore, the maximum force between the stylus and workpiece for a 50 mm stylus will be 1.2 N (120 gf).

SP25M scanning probe systemSP25M: This probe works on a different principle from SP600 and the force exerted on the component varies with the stylus length. In the XY plane, the force at the component varies at a rate of 0.6 N/mm when using a module's shortest specified stylus and 0.2 N/mm when using a module's longest specified stylus. The measurement range is +/-0.5 mm so the max force at the component will be 0.3 N (30 gf) when using a module's shortest specified stylus and 0.1 N (10 gf) when using a module's longest specified stylus. In the z-axis the force varies at a rate of 0.5 N/mm.

SP80 scanning probeSP80: For this probe, the spring rate is 1.8 N/mm in the X, Y and Z axes, with a measurement range of +/-2.5 mm. The maximum contact for is therefore 4.5 N (460 gf).

REVO inspecting blisk 80 x 80 pixelsREVO: The RSP2 REVO probes work on a target deflection range of 50 – 200 microns. The actual force on the component is dependent on the particular stylus holder being used because they have different stiffness. It should be in the range of 0.05 N and 0.25 N (5 gf – 25 gf).

Requirements

See also

Product documents