System description

SFP1 is a dedicated lightweight surface finish measurement probe for use with Renishaw's 5-axis REVO system. The SFP1 probe makes surface finish inspection an integral part of your CMM measurement procedure and the surface finish analysis part of a single measurement report.

SFP1 has a universal body to which different surface finish styli can be fitted. The SFS-1 straight and SFS-2 cranked stylus holders have been designed to facilitate access to a wide range of features. Automatic changing of the SFP1 probe and stylus holders is possible using the standard MRS or MRS2 rack and the RCP TC-2 and RCP2 ports.

The probe takes advantage of REVO's infinite positioning capability, enabling access to a variety of features at different angles. The SFP1 includes a passive C-axis that enables surface finish measurements to be made at all required orientations around a part. The process of changing the C-axis angle is fully automatic, utilising the B-axis positioning of the REVO head to rotate the SFP1. The SFCP (C-axis port) is mounted on the MRS or MRS2 rack and features spring-loaded pins to facilitate rotation of the C-axis using the REVO head's B-axis motion.

Sensor calibration involves measuring the surface finish calibration artefact (SFA) which is mounted on the MRS or MRS2 rack. The calibration software adjusts parameters within the probe in accordance with the calibrated value for the artefact.

Probe characteristics

The SFP1 probe offers surface measurement capability between 6.3 µm and 0.05 μm (250 µin to 2 μin) Ra. SFP1 uses a skidded probe, with a 2 μm radius diamond stylus tip. The skid is held against the surface with a controlled force of approximately 0.2 N whilst the stylus tip force is 0.001 N. The SFS-1 straight stylus holder allows measurement within a 10 mm (0.4 in) diameter bore to a depth of 100 mm (4 in).

Ra, RMS and raw data are returned from UCCServer to the metrology application client software using the I++ DME protocol. The raw data can subsequently be presented to specialist surface analysis software packages for further detailed reporting.

System components overview

SFP

SFP1 surface finish probe.

SFS1 and SFS2 stylus holders

The SFS-1 straight and SFS-2 cranked stylus holders have been designed to facilitate access to a wide range of features.

RCP TC-2

The thermally controlled RCP TC-2 port maintains its stored probe at operating temperature. It is compatible with Renishaw's MRS and MRS2 rack systems.

RCP2

The RCP2 enables rapid and repeatable changing of SFS-1 and SFS-2 stylus holders. It is compatible with Renishaw's MRS and MRS2 rack systems.

SFCP

The SFCP (C-axis port) is mounted on the MRS / MRS2 rack and features spring-loaded pins to facilitate rotation of the C-axis using the REVO head's B-axis motion

SFA

The SFP1 is calibrated using the calibration plate on the SFA (surface finish artefact). It must be mounted on Renishaw's MRS and MRS2 rack systems.