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Combined/hybrid systems literature

Product note

  • Product note: SCA - diamond composite analysis Product note: SCA - diamond composite analysis

    Renishaw’s structural and chemical analyser unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful new technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.

  • Application note: A study of single-wall carbon nanotubes using Renishaw's structural and chemical analyser for scanning electron microscopy Application note: A study of single-wall carbon nanotubes using Renishaw's structural and chemical analyser for scanning electron microscopy

    Electron imaging and Raman spectroscopy are established techniques for viewing and analysing carbon nanotubes. Performing these two techniques usually requires the sample being transferred between a scanning electron microscope (SEM) and a Raman spectrometer. This application note illustrates the advantages of Renishaw’s structural and chemical analyser (SCA) for simultaneous secondary electron imaging and Raman spectroscopy of single-wall carbon nanotubes (SWNTs).

  • SCA oxidation application note - cultural heritage SCA oxidation application note - cultural heritage

    SEM-SCA analysis helps in the preservation of a corroding bronze statue of the Roman god Ares from the ancient city of Zeugma in Turkey.

  • Inverted microscopes for inVia Inverted microscopes for inVia

    Product note: Enabling you to view large samples or biological specimens from below, rather than above, Renishaw's inVia Raman spectrometers can be equipped with inverted microscopes instead of, or in addition to, the standard upright microscopes.

  • Renishaw Raman-AFM/TERS solutions Renishaw Raman-AFM/TERS solutions

    Product note - Combined Raman/AFM (atomic force microscope) systems are excellent for characterising the properties of materials at sub-micrometre, and potentially nanometre, scales.Tip-enhanced Raman scattering (TERS) provides chemical imaging at the nanometre scale, enabling you to take your research to a whole new level.

Application examples

We have also produced a range of application examples, including the following.

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Document referenceDocument description
AS024

AFM and 3D Raman imaging of glioma cells

Reveal detailed and complementary information on the composition of glioma cells by atomic force microscopy (AFM) and inVia 3D Raman imaging. The AFM topograph—with nanometre-range spatial resolution—clearly identify cellular structures, but not their chemical compositions. By comparing and correlating AFM topographs with the additional chemical information from 3D Raman images, researchers can gain a better understanding of the cell.

AS027

See sub-diffraction limit graphene features using tip enhanced Raman spectroscopy

Reveal highly detailed graphene information by performing tip enhanced Raman spectroscopy (TERS) using inVia combined with an AFM. TERS uses a special plasmonic tip to increase the local electric field at the sample which, in turn, increases the Raman intensity.

AS028

TERS of a malachite green monolayer

Analyse minute sample volumes and weak Raman scatterers using inVia and TERS. Tip enhanced Raman spectroscopy (TERS) uses a special plasmonic tip to increase the electric field at the sample which, in turn, increases the Raman intensity. These tips are very small, with diameters on the order of 10 nm to 100 nm, and are held in contact with the sample using a scanning probe microscope (SPM) or atomic force microscope (AFM).