Materials science literature
Application note: Analyse silicon carbide (SiC) with the inVia Raman microscope (pdf)
The properties of silicon carbide are highly dependent on its crystal structure (it can exist in many polytypes), on the quality of the crystal, and on the number and types of defects present. Manufacturers of silicon carbide raw material and devices need to monitor and control these attributes to enhance yield. The first step in controlling these parameters is to measure them repeatably and quantifiably. Renishaw’s Raman systems are ideal for this.
Analyse 2D materials with the inVia Qontor confocal Raman microscope
With so many unique properties, working with 2D materials can be challenging. Whether it is large regions, uneven samples, or small discrete flakes, Renishaw’s inVia Qontor confocal Raman microscope gives you reliable results, quickly and easily.
Application note: Analyse lithium-ion batteries with the inVia™ confocal Raman microscope
Chemically characterise lithium-ion batteries with Renishaw’s inVia Raman microscope. inVia is the ultimate system for studies ranging from fundamental research on the materials involved through to final product quality control and failure analysis.
Application note: Analyse Li-ion battery anodes with the inVia™ confocal Raman microscope
The inVia confocal Raman microscope is ideal for locating, discriminating, and quantifying the different forms of carbon present in anodes, even those with subtle variations in structure.
StreamHR Rapide - graphene
Using a Renishaw inVia confocal Raman microscope and WiRE™ software to image graphene. The image build up is shown at true data collection speed using StreamHR Rapide. The analysis clearly shows monolayer and multilayer graphene. A second image shows defects in the graphene.
We have also produced a range of application examples, including the following.
If you would like to find out more, please contact your local representative using the button below, quoting the relevant document reference.
|Document reference||Document description|
SEM-SCA identification of residue on a steel component
Steel components that had exhibited poor in-service wear resistance were provided to identify the nature of a suspicious residue noted during stereo optical microscopy observation. In-SEM Raman spectroscopy determined that the residue comprised a paste containing particulates – the particles were identified as diamond (characterised by a band at 1333 cm-1), and the carrier paste as an organic substance. The residue is most likely the remains of polishing compound.
Common substrate spectra using different laser excitation wavelengths
This document provides information on the suitability of various common substrates when preparing a sample for Raman analysis. Some common substrates can provide complex backgrounds, which can complicate the interpretation of Raman bands from the sample. It is therefore important to understand which option is the most appropriate for a given sample and excitation configuration.
Probe interlayer interactions in graphene
Open new research opportunities by investigating interlayer interactions in graphene and other two dimensional crystals, using an inVia Raman microscope equipped with Eclipse filters.
See sub-diffraction limit graphene features using tip enhanced Raman spectroscopy
Reveal highly detailed graphene information by performing tip enhanced Raman spectroscopy (TERS) using inVia combined with an AFM. TERS uses a special plasmonic tip to increase the local electric field at the sample which, in turn, increases the Raman intensity.
TERS of a malachite green monolayer
Analyse minute sample volumes and weak Raman scatterers using inVia and TERS. Tip enhanced Raman spectroscopy (TERS) uses a special plasmonic tip to increase the electric field at the sample which, in turn, increases the Raman intensity. These tips are very small, with diameters on the order of 10 nm to 100 nm, and are held in contact with the sample using a scanning probe microscope (SPM) or atomic force microscope (AFM).
Raman imaging analysis of graphene flakes
Identify the number of graphene layers present in your sample quickly and easily using StreamLine imaging.
Locate and characterise defects in SiC
Learn more about the defects in SiC using StreamLineHR 3D imaging. Raman spectroscopy is a powerful tool for investigating SiC.
Visualise polytype, strain/stress and nitrogen concentrations in SiC using inVia
Use StreamLineHR to image polytype, strain/stress and nitrogen doping in SiC.
Raman measurements on graphene
The high specifity of inVia enables graphene to be easily differentiated from other materials, including carbon allotropes such as carbon nanotube and diamond.
Characterising DLC with combined in situ Raman spectroscopy and nanoindentation
Renishaw and Hysitron have combined an inVia confocal Raman microscope with TI 950 Tribolndenter, producing a system with the capability to directly correlate mechanical properties measurements with comprehensive chemical analyse, in situ.