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Renishaw adds to the comprehensive imaging options available with its inVia confocal Raman microscope

22nd January 2015

Renishaw will be exhibiting its inVia confocal Raman microscope at Pittcon 2015, at the Ernest N. Morial Convention Center, New Orleans, USA, from 8 – 12 March.

Raman image of SiC wafer illustrating different crystal polytypes

The inVia system enables users to study the widest range of samples with the broadest range of Raman imaging techniques. Renishaw's unique suite of complementary imaging options make it easy for users to get the chemical and structural information they need. On stand 2808, Renishaw's experts will explain the collective benefits of each technique and how the addition of transmission Raman provides maximum flexibility.

Applications Scientist, Pippa Law, will give a presentation on transmission Raman on 9 March, at 2.30 pm. She will explain how transmission Raman is an attractive method for the fast, quantitative analysis of bulk material homogeneity. With a focus on pharmaceuticals, she will demonstrate the significant benefits that transmission Raman offers for applications such as tablet dose and blend uniformity.

Join Renishaw at Pittcon, or contact a local sales representative to discover how the inVia confocal Raman microscope can generate outstanding Raman images.

Image: Raman image of a SiC wafer illustrating different crystal polytypes.


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