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Stylus contact forces for CMM scanning probes

SP600

SP600 scanning probe

The relevant spring rate is 1.2 N/mm in the X, Y and Z axes so the force on the component will vary with the amount of deflection. The SP600 measurement range is ±1 mm with a 50 mm stylus.

Therefore, the maximum force between the stylus and workpiece for a 50 mm stylus will be 1.2 N (120 gf).

SP25M

SP25M scanning probe system

This probe works on a different principle from SP600 and the force exerted on the component varies with the stylus length. In the XY plane, the force at the component varies at a rate of 0.6 N/mm when using a module's shortest specified stylus and 0.2 N/mm when using a module's longest specified stylus. The measurement range is ±0.5 mm so the max force at the component will be 0.3 N (30 gf) when using a module's shortest specified stylus and 0.1 N (10 gf) when using a module's longest specified stylus. In the Z-axis the force varies at a rate of 0.5 N/mm.

SP80

SP80 scanning probe

For this probe, the spring rate is 1.8 N/mm in the X, Y and Z axes, with a measurement range of ±2.5 mm. The maximum contact for is therefore 4.5 N (460 gf).

REVO

REVO inspecting blisk 80 x 80 pixels

The RSP2 REVO probes work on a target deflection range of 50 microns to 200 microns. The actual force on the component is dependent on the particular stylus holder being used because they have different stiffness. It should be in the range of 0.05 N and 0.25 N (5 gf and 25 gf).

See also