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Materials science literature

Application notes


  • StreamHR Rapide - graphene

    Using a Renishaw inVia confocal Raman microscope and WiRE™ software to image graphene. The image build up is shown at true data collection speed using StreamHR Rapide. The analysis clearly shows monolayer and multilayer graphene. A second image shows defects in the graphene.

Application examples

We have also produced a range of application examples, including the following.

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SEM-SCA identification of residue on a steel component

Steel components that had exhibited poor in-service wear resistance were provided to identify the nature of a suspicious residue noted during stereo optical microscopy observation. In-SEM Raman spectroscopy determined that the residue comprised a paste containing particulates – the particles were identified as diamond (characterised by a band at 1333 cm-1), and the carrier paste as an organic substance. The residue is most likely the remains of polishing compound.


Common substrate spectra using different laser excitation wavelengths

This document provides information on the suitability of various common substrates when preparing a sample for Raman analysis. Some common substrates can provide complex backgrounds, which can complicate the interpretation of Raman bands from the sample. It is therefore important to understand which option is the most appropriate for a given sample and excitation configuration.


Probe interlayer interactions in graphene

Open new research opportunities by investigating interlayer interactions in graphene and other two dimensional crystals, using an inVia Raman microscope equipped with Eclipse filters.


See sub-diffraction limit graphene features using tip enhanced Raman spectroscopy

Reveal highly detailed graphene information by performing tip enhanced Raman spectroscopy (TERS) using inVia combined with an AFM. TERS uses a special plasmonic tip to increase the local electric field at the sample which, in turn, increases the Raman intensity.


TERS of a malachite green monolayer

Analyse minute sample volumes and weak Raman scatterers using inVia and TERS. Tip enhanced Raman spectroscopy (TERS) uses a special plasmonic tip to increase the electric field at the sample which, in turn, increases the Raman intensity. These tips are very small, with diameters on the order of 10 nm to 100 nm, and are held in contact with the sample using a scanning probe microscope (SPM) or atomic force microscope (AFM).


Raman imaging analysis of graphene flakes

Identify the number of graphene layers present in your sample quickly and easily using StreamLine imaging.


Locate and characterise defects in SiC

Learn more about the defects in SiC using StreamLineHR 3D imaging. Raman spectroscopy is a powerful tool for investigating SiC.


Visualise polytype, strain/stress and nitrogen concentrations in SiC using inVia

Use StreamLineHR to image polytype, strain/stress and nitrogen doping in SiC.


Raman measurements on graphene

The high specifity of inVia enables graphene to be easily differentiated from other materials, including carbon allotropes such as carbon nanotube and diamond.


Characterising DLC with combined in situ Raman spectroscopy and nanoindentation

Renishaw and Hysitron have combined an inVia confocal Raman microscope with TI 950 Tribolndenter, producing a system with the capability to directly correlate mechanical properties measurements with comprehensive chemical analyse, in situ.