Analyse 2D materials with Renishaw's inVia
The number of layers, doping levels, stress/strain and electrical properties of 2D materials are easily measured, non-destructively, with Renishaw's inVia Qontor confocal Raman microscope. It can rapidly characterise large regions of material—at high resolution—even if they are uneven, such as graphene on copper foil substrates.
The inVia Qontor is incredibly sensitive; its high spectral resolution and high spatial resolution make it ideal for analysing all the main 2D materials, including MoS2, hBN and WSe2 and graphene.
2D materials have huge potential for use in a wide range of future technologies. Raman spectroscopy is an indispensible technique for revealing their structure and composition.
Analyse samples with uneven, curved or rough surfaces
Renishaw's LiveTrack™ focus-tracking technology makes it easy to study uneven samples. It maintains sample focus, in real time, even when mapping large, uneven areas. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.
Analyse monolayers and thin films
The high sensitivity of Renishaw's Raman systems makes identifying and analysing single, or just a few, atomic layers quick and easy.
Download an application note
Application note: Analyse 2D materials with the inVia Qontor confocal Raman microscope
With so many unique properties, working with 2D materials can be challenging. Whether it is large regions, uneven samples, or small discrete flakes, Renishaw’s inVia Qontor confocal Raman microscope gives you reliable results, quickly and easily.
Watch a movie
StreamHR Rapide - graphene
Using a Renishaw inVia confocal Raman microscope and WiRE™ software to image graphene. The image build up is shown at true data collection speed using StreamHR Rapide. The analysis clearly shows monolayer and multilayer graphene. A second image shows defects in the graphene.