SiC inclusion silicon carbide taken on an inVia confocal Raman microscope (jpg)

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3D Raman image of core inclusion, showing: 3C-SiC inclusion (red); 4H-SiC epilayer (green); doped 4H-SiC substrate (blue). Sample courtesy of Prof. Noboru Ohtani, Kwansei Gakuin University, Japan.

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