News release: Identifying imperfections with Raman spectroscopy (pdf)

File size: 2.25 MB Language: English

An article in Compound Semiconductor magazine, October 2015, describes how Raman spectroscopy allows routine mapping of SiC wafers in little more than an hour.

This type of file requires a viewer, freely available from Adobe

Didn't find what you were looking for?

Tell us what you couldn’t find and we will do our best to help.