TP200 touch-trigger probe components

TP200 probe body

• Incorporates micro strain gauge transducers, delivering excellent repeatability and accurate 3D form measurement even with long styli
• Sensor technology gives sub-micron triggering performance and eliminates the lobing characteristics encountered with standard probes
• The solid-state ASIC electronics within the probe ensure reliable operation over millions of trigger points

TP200B probe body

• The TP200B probe has a higher tolerance to vibration
• Reduced instances of 'air' trigger generation which can arise from vibrations transmitted through the CMM or when using longer styli and faster positioning speeds

TP200 stylus module

• Stylus module mount via a highly repeatable kinematic joint, providing a rapid stylus changing capability and probe overtravel protection
• Three modules are available, with two different overtravel forces
• SF (standard force) module is suitable for most applications
• LF (low force) module is recommended for use with small precision ball styli or on delicate materials
• The EO (extended overtravel) module is recommended if an increased CMM speed may lead to stopping distances which exceed the overtravel range provided in the SF / LF modules. The EO module has an additional 8 mm (0.32 in) of overtravel in the probe Z-axis to protect against damage to the sensor in such circumstances. Overtravel force is the same as the SF module.

Probe maintenance - CK200 (A-1085-0016) is a specialised cleaning material supplied for the removal of contamination from the location faces of the magnetically retained kinematic couplings of the TP20, TP200 and SP25M probe systems. The frequency of cleaning should be determined by the conditions of use.