LiveTrack™

イメージギャラリ

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  LiveTrack silicon wafer

  Indentation of a silicon wafer by a diamond Vickers indenter, using 500 g load. Confocal StreamHR Raman data collected at 532 nm excitation with LiveTrack (100× objective). The analysed surface is 78 µm wide, 58 µm deep, and 4.6 µm high. The topography image (left) shows median and lateral cracking, and material removal by chipping. The image also reveals the raised area surrounding the indent, caused by the plastic deformation. The Raman image (right) reveals stresses around the indent (compressive regions white/yellow, tensile regions black/dark red). The blue-green region within the indent is silicon that has been very highly plastically deformed, with a highly amorphous structure.

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  LiveTrack screwdriver bit

  Analysis of a coated flat-head screwdriver bit. StreamHR confocal Raman data were collected at 532 nm excitation, with LiveTrack (20× objective); two images were generated, with the bit oriented side- and end-on. The images reveal the distributions of TiN (green) and TiO2 (magenta). The imaged surfaces are: 4.3 mm wide, 4.0 mm deep, and 6.4 mm high (left image); and 8.1 mm wide, 5.1 mm deep and 3.6 mm high (right image).

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  虎目石

  主成分が石英の石（虎目石）。532nm 励起レーザーと 20 倍対物レンズを使用して観察。ラマンイメージには石英（シアン）と無機炭酸塩（黄色）が示されています。測定エリア：幅 47mm、奥行 26mm、高さ 3.0mm。

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  Fresnel lens

  Image of a Fresnel lens showing the concentric ring lens topography and, from Raman analysis, contamination (red), which is preferentially located in the grooves of the rings. Data were collected using 532 nm excitation and a 50× objective. The analysed surface is 4.5 mm wide, 1.3 mm deep, and 24 µm high.

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