Whitepapers - CMM products

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• White paper: Unlock the hidden potential of your CMMs
  

  White paper: Unlock the hidden potential of your CMMs

  Advances in sensors, metrology software and controller technology now offer the opportunity to transform existing CMMs, providing greater accuracy, faster measurement, more automation and new capabilities, whilst taking full advantage of CAD-driven programming.

  [527kB]
• White paper: SP80 and SP80H
  

  White paper: SP80 and SP80H

  No description available

  [690kB]
• Technical note: SP25M
  

  Technical note: SP25M

  At only 25 mm in diameter, and with a range of modules for high performance scanning and touch trigger probing, Renishaw’s innovative SP25M is “the world’s most compact and versatile scanning probe system”.

  [189kB]
• Technical note: SP600M ISO 10360-4 performance
  

  Technical note: SP600M ISO 10360-4 performance

  Testing SP600 scanning performance at different stylus deflections and a range of stylus lengths.ISO 10360-4 test at different nominal deflections (using just one calibration).Same tests performed at different stylus lengths (50 mm to 200 mm) ISO 10360-4

  [36kB]
• Technical note: The dynamics of co-ordinate measuring machines (CMMs)
  

  Technical note: The dynamics of co-ordinate measuring machines (CMMs)

  Machine dynamics limit measurement accuracy at higher scanning speeds, creating a barrier to rapid measurement. Scanning is different to touch trigger probing in that the machine’s dynamic performance is much more important than the static performance, the machine being under inertial load throughout. This leads to deflections in the structure that are very difficult to predict. Conventional scanning systems achieve accuracy by moving slowly. This compromises inspection productivity and is what Renishaw calls the dynamic performance barrier.

  [100kB]
• Educational article: The sensors
  

  Educational article: The sensors

  Article nr. 2 – 3rd Part

  [468kB]
• Educational article: Computer Tomography applied to 3 Dimensional Metrology
  

  Educational article: Computer Tomography applied to 3 Dimensional Metrology

  ia cmmm educational article on Computer Tomography applied to 3 Dimensional Metrology

  [388kB]