 | | SPM-Raman system
 Scanning probe microscopes (SPMs) are a class of instrument that investigate materials by analysing local properties with a sub-micrometer probe. Many different probe types exist, including atomic force microscopy (AFM) probes, thermal property probes, and electrical property probes. The very high spatial resolutions of these systems have been employed in many application areas,and especially in nanotechnology.
By coupling the inVia Raman microscope to SPMs (also known as Raman-AFM), Renishaw has added the chemical analysis power of Raman spectroscopy to the high spatial resolution of the SPM, further enhancing these invaluable tools.
Combining inVia Raman microscopes with scanning probe microscopes
The Renishaw inVia Raman microscope can be coupled to a wide range of scanning probe microscopes, such as those of Nanonics Imaging Ltd.
These combined instruments can operate in many scanning probe modes, enabling users to investigate many properties of materials at sub-micrometer distance scales. Some examples are:
- AFM with far-field Raman
Offers users high spatial resolution scanning probe data, combined with rapid far-field Raman data (typically 0.5 µm resolution). Raman data can be recorded and correlated with high spatial resolution topographic, electrical, thermal and near-field optical data.
- Near-field Raman (NSOM)
This technique uses a sub-wavelength aperture (the tip of a tapered optical fibre) to deliver laser light to the sample, resulting in high spatial resolution Raman data.
- Near-field aperture-less Raman
A tip is used to enhance the Raman signal at a very localised region of the sample, within a larger area that is being illuminated with laser light. This technique offers the high spatial resolution of near-field (NSOM) Raman, but with higher signal levels.
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