Raman-AFM system

Extend your understanding of the nanoscale

Renishaw has developed optimised direct coupling technology making the inVia Raman microscope the perfect partner for coupling to a wide variety of SPM's, offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.

The inVia Raman microscope offers the potential for coupling to any SPM or AFM. Fully integrated systems are available for scanning probe microscopes from Bruker, NT-MDT, and Nanonics Imaging Ltd.

Nanotechnology visualisation and analysis systems for research and industry

Maximise productivity

Renishaw can offer fully integrated systems using Bruker Nano, NT-MDT, and Nanonics Imaging Ltd scanners. Raman-AFM systems from Renishaw deliver the following:

• More time for you with integrated systems - the mechanical and software integration is complete, allowing you to focus on data collection and analysis;
• Faster data collection - direct coupling between the sample and the Raman spectrometer gives optimum efficiency in all configurations;
• Trust the experts - the first TERS measurements on a semiconductor device (published 2001) and the first Raman-AFM/NSOM measurements (published 1995) were performed using Renishaw Raman systems;
• You choose - Renishaw has the experience and expertise to integrate your choice of SPM system.

What can a Renishaw Raman-SPM system do for you?

AFM with Raman
You can acquire high spatial resolution scanning probe data and rapid far-field Raman data (typically sub-micrometer resolution). Raman data can be recorded and correlated with high spatial resolution topographic, electrical, thermal and near-field optical data.

Raman analysis of a graphene sample (see image on right) identified five distinct graphene thicknesses, including monolayer and bilayer regions. The Raman data was used to guide SPM experiments, enabling topographical, capacitance and conduction measurements in the regions of interest.

TERS (or near-field aperture-less Raman)
A tip is used to enhance the Raman signal at a very localised region of the sample, within a larger area that is being illuminated with laser light. This configuration offers the highest spatial resolution of any Raman technique.

The superior spatial sensitivity offered by TERS can be demonstrated using layered materials. The image opposite compares near field (TERS) and far-field spectrum of a thin silicon layer on SiGe. The superior surface sensitivity offered by TERS generates a much more intense silicon Raman band (at a lower Raman frequency than the SiGe Raman band from the bulk).

To discover how this technology can extend your understanding of the nanoscale, or to learn more about integrating any SPM or AFM model with the inVia Raman microscope, please complete the online request form, or contact your local Renishaw Raman representative.

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