| Data format |
Digital - RS422 quadrature
Analogue - 1 Vpp sine / cosine |
| Resolution |
Digital - user selectable to 10 nm (with plane mirror target optic)
Analogue - sub-nanometre via external interpolation (e.g. RPI20 parallel interface) |
| Maximum velocity |
1 m/s (when using plane mirror target optic) |
| Laser type |
HeNe (Helium / Neon), 632.8 NTP wavelength, Class II |
| Laser frequency stability |
±50 ppb (RLU10) over any one hour period
±2 ppb (RLU20) over any one hour period |
| Laser lifetime |
>50,000 hours |
| Maximum axis length |
1 m (when using plane mirror target optic) |
For non-vacuum applications some form of refractive index compensation is required to maintain accuracy under fluctuating environmental conditions. Renishaw offers the RCU10 real-time quadrature compensation system to compensate for these variances.
Resolutions to 38.6 picometres can be achieved by integrating an RPI20 parallel interface into the RLE system. This interface accepts differential analogue 1 Vpp sine / cosine signals and provides a parallal format output. See Accessories for information on the RCU10 compensation system, the RPI20 and other auxiliary equipment for use with RLE systems and the HS10 long-range laser scale.
X-Y (planar) RLE systems comprise a dual axis RLU laser unit and two detector heads (configured for use with plane mirror target optics). Choice of laser unit is very much dependant on operating environment, with the RLU20 being particularly suited to vacuum and controlled environment applications. RLU10 laser units are used within RLE10 systems, and RLU20 laser units in RLE20 systems.