Raman-AFM system

Extend your understanding of the nanoscale

As well as providing co-localised Raman AFM measurements these combined systems can be used to collect Tip Enhanced Raman Spectroscopy (TERS) and to conduct near-field measurements (SNOM, NSOM). Combined Raman AFM measurements allow the investigating and characterisation of chemical and structural properties of materials at sub-micrometer scales.

Nanotechnology visualisation and analysis systems for research and industry

• Measure physical properties at molecular resolution and conduct chemical analysis on the sub-micrometer scale.
• Simultaneous Raman and AFM guarantee correlation between images.
• One platform solution provides confidence, reliability, and ease of use.

Simultaneously collected AFM and Raman images of a 60 nm diameter silicon nano-wire (Sample courtesy of M Kuball, University of Bristol, England, and J Redwing, Penn State University, USA).

Maximise productivity

Renishaw offers fully integrated solutions with the Bruker Nano Surfaces Innova, the Bruker Nano Surfaces Bioscope Catalyst, the Nanonics MV series and the NT-MDT Ntegra.

Fully integrated Raman-AFM systems from Renishaw deliver the following:

• More time for you with integrated systems - the mechanical and software integration is complete, allowing you to focus on data collection and analysis.
• Faster data collection - direct coupling between the sample and the Raman spectrometer gives optimum efficiency in all configurations.
• Trust the experts - pioneering advances were performed using Renishaw Raman systems:

• • The first Raman-AFM/NSOM measurements
    "Development of a scanning near-field optical probe for localised Raman spectroscopy"
    A. Smith et al. Ultramicroscopy 61, pp. 247 – 252 (1995) .

  • The first TERS measurements on a semiconductor device
    "A practical nanoscopic Raman imaging technique realized by near-field enhancement"
    Sun et al. Mater. Phys. Mech. 4, pp. 17-21 (2001)

• You choose - Renishaw has the experience and expertise to integrate to your choice of AFM system, or to recommend a system based on your specific requirements.

What can a Renishaw Raman-AFM system do for you?

Raman with AFM

Raman data can be recorded and correlated with high spatial resolution topographic, electrical, thermal and near-field optical data provided by the AFM.

Raman analysis of a graphene sample identified five distinct graphene thicknesses, including monolayer and bilayer regions. The Raman data was used to guide AFM experiments, enabling topographical, capacitance and conduction measurements in the regions of interest.

Tip Enhanced Raman Spectroscopy (TERS)

The spatial resolution of Raman spectroscopy is diffraction-limited to approximately half the wavelength of the incident laser light, because both the illuminating laser light and the Raman scattered light are collected in the optical far field. One way to achieve higher spatial resolution is to use a near field technique such as TERS. This technique involves using a plasmonic tip with a small apex to enhance the Raman signal at a very localised area of the sample. The Raman information from this small area can then be separated from the far field data potentially achieving resolutions better than 15 nm.

The Renishaw inVia Raman microscope has been used to collect TERS data in conjunction with a wide range of 3rd party instruments.

	TERS and far-field spectra of malachite green on gold. The TERS spectrum is more than 10× stronger than the far-field spectra.
	TERS spectrum and far-field spectrum of a thin silicon layer on SiGe. The superior surface sensitivity offered by TERS generates a significantly more intense silicon Raman band (at a lower Raman frequency than the SiGe Raman band from the bulk).

Further information

To discover how this technology can extend your understanding of the nanoscale, or to learn more about integrating any SPM model with the inVia Raman microscope, please complete the online request form, or contact your local Renishaw Raman representative.

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