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The ultimate sample surface/interface tracking technology

With LiveTrack™ focus tracking technology, optimum focus is maintained automatically in real time during data collection and white light video viewing.

Uneven, curved or rough surfaces

Quickly acquire accurate and reproducible spectra from samples with extensive topographic variations.

  • Tigers Eye rock Tigers Eye rock

Track focus in white light mode

Visually survey your sample to find regions of interest without the need for inconvenient manual focusing, or time consuming pre-scanning or sample preparation.

A technology for all samples

Use LiveTrack with all of Renishaw's Raman image generation techniques. Maintain sub-micrometre focus even on samples that have height variations of many millimetres. Analyse samples that were previously impractical to study, or would have required extensive sample preparation. Generate Raman images and layer these onto 3D views of the sample topography. Manipulate these images in 3D - you choose the view!

Simple to use. Just turn it on!

LiveTrack provides continuous feedback to the sample stage, which adjusts to follow the height of the sample. No time consuming set-up is needed – just focus the sample and turn on LiveTrack.

Download a product note

  • Product note: inVia Qontor confocal Raman microscope Product note: inVia Qontor confocal Raman microscope

    The inVia™ Qontor® confocal Raman microscope is a flexible research-grade instrument with unique real-time focus tracking capabilities. The inVia Qontor retains all the functions of Renishaw’s world-renowned inVia Reflex™ microscope and adds a range of usability features, including powerful LiveTrack™ focus tracking technology. Now you can easily study samples with uneven, curved, or rough surfaces.

Watch a movie

  • inVia Qontor

    A movie demonstrating the inVia Qontor confocal Raman microscope

  • 3D Raman chemical image showing an indentation made on a silicon wafer by a diamond Vickers indenter.

    Renishaw’s LiveTrack™ focus-tracking technology makes it easy to study samples with uneven, curved, or rough surfaces. This 3D Raman image of an indented silicon wafer reveals stresses around the indent (compressive regions white/yellow, tensile regions black/dark red). The blue-green region within the indent is silicon that has been very highly plastically deformed, with a highly amorphous structure.

Image gallery

  • LiveTrack silicon wafer
  • LiveTrack screwdriver bit
  • Tigers Eye rock
  • Fresnel lens

Alternatives to LiveTrack

LiveTrack is available only with the inVia Qontor.

Alternative technologies are available on other inVia Raman systems

Many aspects of Renishaw's innovative technology are covered by patents.