TP200 / TP200B

The TP200 / TP200B are electronic probes using strain gauge technology, which gives higher accuracy than kinematic touch-trigger probes. They combine outstanding metrology performance with superior functionality to produce a highly versatile DCC CMM probing system, with excellent productivity.

Features and benefits

• Excellent repeatability and precision 3D form measurement
• Rapid exchange between stylus configurations without the need to re-calibrate
• 6-way measuring capability (±X, ±Y, ±Z)
• Zero reseat errors and no lobing effect
• Suitable for intensive 'peck' or 'stitch' scanning
• Stylus reach up to 100 mm (3.99 in) GF range
• Module life of more than 10 million triggers
• Compatible with the full range of Renishaw probe heads and accessories

System components

TP200 probe body

• Incorporates micro strain gauge transducers, delivering excellent repeatability and accurate 3D form measurement even with long styli
• Sensor technology gives sub-micron triggering performance and eliminates the lobing characteristics encountered with standard probes
• The solid-state ASIC electronics within the probe ensure reliable operation over millions of trigger points

TP200B probe body

• The TP200B probe has a higher tolerance to vibration
• Reduced instances of 'air' trigger generation which can arise from vibrations transmitted through the CMM or when using longer styli and faster positioning speeds

TP200 stylus module

• Stylus module mount via a highly repeatable kinematic joint, providing a rapid stylus changing capability and probe overtravel protection
• Three modules are available, with two different overtravel forces
• SF (standard force) module is suitable for most applications
• LF (low force) module is recommended for use with small precision ball styli or on delicate materials
• The EO (extended overtravel) module is recommended if an increased CMM speed may lead to stopping distances which exceed the overtravel range provided in the SF / LF modules. The EO module has an additional 8 mm (0.32 in) of overtravel in the probe Z axis to protect against damage to the sensor in such circumstances. Overtravel force is the same as the SF module.

Probe maintenance - CK200 (A-1085-0016) is a specialised cleaning material supplied for the removal of contamination from the location faces of the magnetically retained kinematic couplings of the TP20, TP200 and SP25M probe systems. The frequency of cleaning should be determined by the conditions of use.