SFP1 legacy probe

Surface finish / surface roughness measurement

• Traditionally measured with hand-held sensors or on a dedicated measuring
  machine
• REVO-2 SFP1 probe makes surface finish inspection an integral part of your
  CMM measurement procedure
• Surface finish analysis can form part of a single measurement report

System benefits:

• Automatic changing of the SFP1 probe and stylus holders is possible using the standard MRS / MRS2 rack and RCP ports - this enables surface finish measurement to be fully integrated with the standard CMM inspection program
• The SFP1 probe takes advantage of the infinite positioning capability of the REVO-2 head
• Sensor calibration involves measuring the surface finish of the surface finish calibration artefact
  (SFA) that is mounted on the MRS / MRS2 rack - the calibration software adjusts parameters within
  the probe in accordance with the calibrated value for the artefact
• The SFP1 includes a passive C-axis that enables surface finish measurements to be made at
  all required orientations around a part - the process of changing the C-axis angle is fully
  automatic, utilising the B-axis positioning of the REVO-2 head to rotate the SFP1
• The SFCP (C-axis port) is mounted on the MRS / MRS2 rack and features spring-loaded pins to facilitate rotation of the C-axis using the REVO-2 head's B-axis motion

C-axis

The SFP1 has a C-axis that enables surface finish measurements to be made at all required orientations around a part. The process of moving the C-axis is fully automatic utilising both the REVO-2 head B-axis and SFCP. The reorientation routine is handled completely through UCCserver.

Probe characteristics

• SFP1 is a skidded probe type with a 2 μm radius diamond stylus tip - the skid is held against the surface with a controlled force of approximately 0.2 N whilst the stylus tip force is 0.001 N
• The SFS-1 straight and SFS-2 cranked stylus holders have been designed to facilitate access to a wide range of features
• The probe size with a straight stylus holder allows measurement within a 10 mm diameter bore to a depth of 100 mm
• Surface measurement capability: 6.3 µm to 0.05 µm Ra
• Output: Ra, RMS and raw data are returned from UCCserver to the metrology application client software using the I++ DME protocol - the raw data can subsequently be presented to specialist surface analysis software packages for further detailed reporting

SFP1 and SFS-# changing system

The RCP TC-2 (thermally controlled REVO-2 change port) is used for changing SFP1, whereas the RCP2 (REVO-2 change port) is configured to change SFP1 styli (SFS-1 and SFS-2).

Dimensions