Combine imaging techniques with the Correlate™ module
Get more out of your microscopes
The Correlate™ module enables the comparison of Raman results with many commonly used microscopy systems including Scanning Electron Microscopy (SEM), fluorescence, Atomic Force Microscopy (AFM), Infra-red and optical microscopes.
Features at a glance
- Coordinate Manager - To import and transform coordinates from commonly used microscopy systems to your Renishaw Raman system
- Image Alignment Tool - With translation, rotation, sizing and aspect ratio control for overlay with variable transparency
- Batch measurements - To automate the same Raman measurement at different positions on the sample
Easy to use
Simply record the coordinates of three or more reference points and data acquisition points on your sample. The Correlate module then guides you to the regions of interest on your samples after you have transferred them between microscopes. This enables you to get the data from the same locations and overlay the images for complementary interpretation.
See the full picture
Try moving the slider on this image of a ReS2 flake to see correlated AFM image with a white light image taken on an inViaTM microscope. By combining the topographic details from the AFM image and images of different crystal domains from the white light image, you can gain a fuller understanding of the sample in one image.
Download more information
Product note: Correlate(TM) module in WiRE(TM) software
A product note to promote the Correlate(TM) feature of the WiRE(TM) software
Application note: Using the Correlate™ module to study a mineralogical section with Raman and SEM
An application note detailing the use of the Correlate™ module of the WiRE™ software to combine a Raman and SEM image of the same section of a mineralogical sample and in so doing creating more powerful data, by combining the chemical and physical information of the two techniques.