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Combine imaging techniques with the Correlate™ module

Get more out of your microscopes

The Correlate™ module enables the comparison of Raman results with many commonly used microscopy systems including Scanning Electron Microscopy (SEM), fluorescence, Atomic Force Microscopy (AFM), Infra-red and optical microscopes.

Features at a glance

  • Coordinate Manager - To import and transform coordinates from commonly used microscopy systems to your Renishaw Raman system
  • Image Alignment Tool - With translation, rotation, sizing and aspect ratio control for overlay with variable transparency
  • Batch measurements - To automate the same Raman measurement at different positions on the sample
News release:  News release:  Correlated SEM and Raman images

Easy to use

Simply record the coordinates of three or more reference points and data acquisition points on your sample. The Correlate module then guides you to the regions of interest on your samples after you have transferred them between microscopes. This enables you to get the data from the same locations and overlay the images for complementary interpretation.

See the full picture

Try moving the slider on this image of a ReS2 flake to see correlated AFM image with a white light image taken on an inViaTM microscope. By combining the topographic details from the AFM image and images of different crystal domains from the white light image, you can gain a fuller understanding of the sample in one image.

The Correlate module is part of Renishaw's WiRE 5.3 software and can be used with the inVia confocal Raman microscope, the Virsa™ Raman Analyser, and the RA800 series.

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