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inVia™ InSpect confocal Raman microscope

Our best-selling confocal Raman microscope optimised for use in forensic laboratories for trace analysis.

Add Raman spectroscopy to your laboratory and gain further powerful capabilities which complement your existing techniques. Analysis is non-contacting and non-destructive and allows you to see fine chemical detail using a research-grade optical microscope.

Identify materials that may be difficult or time consuming with other techniques such as hard crystalline powders, ceramic shards and glass chips, easily analysed with little or no preparation required.

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inVia Inspect Raman microscope


Your inVia InSpect Raman microscope will give you:

  • Highly specific identification - Raman microscopy can differentiate chemical structures, even closely related ones.
  • High spatial resolution - comparable to your other microscopic techniques
  • A range of microscope contrast techniques - including brightfield, darkfield and polarisation contrast with reflected and transmitted light illumination
  • Particle analysis - use advanced image recognition algorithms and instrument control features to characterise particle distributions
  • Correlative imaging - create composite images by combining Raman data with images from other microscopy techniques

For more detailed information, download the inVia InSpect brochure.


Raman image of an ecstasy tablet

Empty Modelling™

Empty Modelling software uses a multivariate analysis technique to resolve complex data into its constituents. Use this, with library searching, to analyse data from samples that contain unknown materials.

inVia Raman microscope objective lens

StreamHR™ Mapping

StreamHR mapping harmonises the operation of the InSpect microscopes high performance detector and MS30 microscope stage. It increases the speed of data collection and saves time generating images.

inVia InSpect Raman microscope

Full automation

You can control alignment, calibration, and configurations all through Renishaw's WiRE software. For example, you can rapidly switch—with a click of a button—between sample viewing and Raman analysis.


Gunshot residue evidence sample collection

Gunshot residue

The inVia InSpect microscope provides a comprehensive package for the analysis of gunshot residue irrespective of its origin, delivering benefits for detection and identification of both organic and inorganic residues. In this note, we explore some of the key characteristics and benefits of the Raman technique for GSR analysis.

Download the application note

Analysing inks in document forgery

Document forgery

There are many different types of inks; colours may be the same, but chemically they can be different. Raman analysis using the inVia Raman microscope allows for rapid, non-destructive testing of questioned areas with the specificity to distinguish similar ink types that may visually look identical.

Read the article

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Downloads: inVia InSpect Raman microscope



Wavelength range 200 nm to 2200 nm
Lasers supportedFrom 229 nm to 1064 nm
Spectral resolution0.3 cm-1 (FWHM)
Highest typically necessary: 1 cm-1
Stability < ±0.01 cm-1Variation in the centre frequency of curve-fitted Si 520 cm-1 band, following repeat measurements. Achieved using a spectral resolution of 1 cm-1 or higher
Low wavenumber cut-off5 cm-1Lowest typically necessary: 100 cm-1
High wavenumber cut-off30,000 cm-1Standard: 4,000 cm-1
Spatial resolution (lateral)0.25 µmStandard: 1 µm
Spatial resolution (axial)< 1 µmStandard: < 2 µm. Dependent on objective and laser
Detector size (standard)1024 pixel × 256 pixel Other options available
Detector operating temperature-70 °C
Rayleigh filters supportedUnlimitedUp to four filter sets in automated mount. Unlimited additional filter sets supported by user-switchable accurately-locating kinematic mounts
Number of lasers supportedUnlimitedOne as standard. Additional lasers beyond 4 require mounting on an optical table
Windows PC controlledLatest specification Windows® PCIncludes PC workstation, monitor, keyboard and trackball
Supply voltage110 V AC to 240 V AC +10% -15%
Supply frequency50 Hz or 60 Hz
Typical power consumption (spectrometer)150 W
Depth (dual-laser systems)930 mmDual laser baseplate
Depth (triple-laser systems)1116 mmTriple laser baseplate
Depth (compact)610 mmUp to three lasers (laser type dependant)
Typical mass (excluding lasers)90 kg