Combined Raman systems
Couple your Renishaw inVia™ confocal Raman microscope or Virsa™ Raman analyser to other analytical instruments and gain multimodal imaging capabilities. Renishaw's Raman spectrometers have been successfully combined with a wide range of analytical techniques including atomic force microscopy (AFM) with tip-enhanced Raman spectroscopy (TERS), scanning electron microscopy (SEM), fluorescence lifetime imaging microscopy (FLIM), nanoindentation, and infrared (IR) thermography. In addition, Renishaw Raman instruments can be configured for photoluminescence (PL) and photocurrent imaging.
For an efficient workflow, you can analyse your sample with two or more characterisation techniques on a single integrated instrument. With Renishaw's correlative microscopy systems, you can be confident that you are analysing the same point with more than one technique. Explore some of our combined Raman systems below.
You can combine the inVia™ Raman microscope with a wide range of scanning probe microscopes (SPMs) and atomic force microscopes (AFMs) to reveal complementary information such as topography and mechanical properties. Add tip-enhanced Raman spectroscopy (TERS) for nanometre-scale chemical resolution.
Fluorescence lifetime imaging microscopy (FLIM)
FLIM can be integrated with an inVia Raman microscope to collect a spatial image showing the fluorescence lifetime of a fluorophore. FLIM is used in cell biology for environmental sensing, monitoring molecular interactions, and fluorophore identification.
Equip your inVia confocal Raman microscope to map photocurrents generated from the incident laser light. Photocurrent mapping of photovoltaic devices reveals the electronic, optical, and charge transport properties of the material.
Use photoluminescence (PL) to study the electronic properties of materials. You can configure your inVia microscope to study crystal defects, atomic vacancies and substitutions. PL is useful for analysing materials like photovoltaics, semiconductors and gemstones.
Combine the power of the inVia Raman microscope with nanoindentation measurements and directly correlate mechanical and tribological properties with chemical information such as crystallinity, polymorphism, phase and stress.
inLux™ SEM Raman interface
The inLux SEM Raman interface brings high-quality Raman functionality to your SEM chamber. Now you can collect Raman images in 2D and 3D whilst simultaneously collecting high-resolution SEM images.
Medium wavelength infrared (MWIR) Raman thermography
The Virsa analyser can be fibre-coupled with a MWIR temperature measurement microscope. Use Raman thermography on semiconductor devices to determine the local temperature with submicron lateral spatial resolution.
Other custom solutions
If our standard products don't match your exact needs, our Special Products Team are experienced at developing custom solutions to meet user requirements. Explore examples of Raman integration at synchrotron beamlines and routine QA/QC analysis environments.
On-demand webinar: Combining Raman spectroscopy with other techniques, for data rich science
Raman spectroscopy is often one tool amongst the many required to solve complex research challenges. Renishaw has developed the inVia microscope to be used in conjunction with other techniques, to collect correlated data and to build a better picture of the science underpinning your samples. In this webinar, we will present Raman data collected in conjunction with other techniques such as photocurrent measurements, PL, SEM, AFM, topography measurements, and Rayleigh scattering.
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