Renishaw XM-60 多光束校正儀在半導體晶圓檢測的應用 (mp4)
File size: 470.58 MB
Language: 中文（繁體）
Dimensions: 1920 x 1080 px
景美專注製造精密的探針卡應用在半導體製程，積極尋找校正方案，並導入 XM-60 多光束校正儀和 QC20 循圓測試儀，對生產設備進行校正。
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